知识与财富的链接
文章基于阿列纽斯经验公式,利用相关标准中的数据,拟合得到硅集成电路老炼试验温度和时间的关系,根据这种关系可以确定在标准未规定的高温下硅集成电路的老炼时间,同时预计了硅集成电路的工作寿命。最后基于经典的温度应力加速试验模型进行了分析,并与前者进行了对比。
Based on the Arrhenius equation, using the data from the standards which are widely used, an analysis is made to obtain the relations between temperature and time for silicon semiconductor integrated circuits. These relations can be used to forecast the lifetime of the operated silicon semiconductor integrate circuit. The above-mentioned relations are compared with conventional relations.
