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用于WLAN(802.11b)基带处理器芯片组的高速ADC及DAC的测试
Test of High Speed ADC/DAC for WLAN(802.11b) BBP Chipset

用于WLAN(802.11b)基带处理器芯片组的高速ADC及DAC的测试

ISSN:1004-4507
2004年第33卷第5期
测试与测量技术
朱海平[1],张向民[2] ZHU Hai-ping,ZHANG Xiang-min[. Advantest
  1. 爱德万测试(苏州)有限公司,江苏苏州
  2. 清华大学微电子研究所,北京
Suzhou

简要介绍了清华大学微电子研究所设计的用于WLAN(802.11b)基带处理器芯片组的高速ADC及DAC,以及爱德万测试如何使用WVFG/WVFD实现高速ADC蛐DAC的测试。

In this time, a high speed ADC and a high speed DAC have been designed by Institute of Microelectronics, Tsinghua University, which are used in the base band processor for WLAN (802.11b) chipset. Since the sampling frequency is very high, it is difficult to test these devices. ADVANTEST has successfully achieved the mixed signal ICs test with T6673(SoC test system).This paper introduces these devices and the measurement result of high speed mixed signal test.

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ISSN:1004-4507
2004年第33卷第5期
测试与测量技术

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